{"id":1375,"date":"2025-10-10T01:23:47","date_gmt":"2025-10-10T01:23:47","guid":{"rendered":"https:\/\/www.wallisemi.com\/?p=1375"},"modified":"2025-10-13T01:30:07","modified_gmt":"2025-10-13T01:30:07","slug":"design-and-implementation-of-an-automated-testing-platform-for-satellite-navigation-rfchips","status":"publish","type":"post","link":"https:\/\/www.wallisemi.com\/es\/blog\/industry-insights\/design-and-implementation-of-an-automated-testing-platform-for-satellite-navigation-rfchips\/","title":{"rendered":"Dise\u00f1o e implantaci\u00f3n de una plataforma de pruebas automatizada para chips de radiofrecuencia de navegaci\u00f3n por sat\u00e9lite"},"content":{"rendered":"

RFchips<\/strong> are core components of navigation terminals, directly affecting the overall performance of terminal products. As the BeiDou satellite navigation system<\/strong> becomes more widely used, the demand for RFchip<\/strong> testing has surged. Traditional testing methods can no longer meet the increasing requirements for high efficiency and precision. To address this challenge, this paper designs and implements an automated testing platform for satellite navigation RFchips<\/strong>, effectively improving both testing efficiency and accuracy.<\/p>\n\n\n\n

RFchip Automated Testing Platform: Key Features<\/strong><\/strong><\/h5>\n\n\n\n

El RFchip<\/strong> automated testing platform is designed based on principles of openness, flexibility, and scalability<\/strong>. It integrates standard testing instruments such as signal generators<\/strong>, spectrum analyzers<\/strong>, y vector network analyzers<\/strong>. The platform uses programmable power supplies and specialized test fixtures to support universal interfaces<\/strong> for testing various models of RFchips<\/strong>.<\/p>\n\n\n\n

The working principle of the testing platform revolves around simulating the normal operating conditions of RFchips<\/strong>. It achieves this by sending SPI commands<\/strong> to configure the RFchip<\/strong>\u2019s operational state, inputting excitation signals, and collecting output signals for performance evaluation.<\/p>\n\n\n\n

Key Performance Indicators Tested in RFchips<\/strong><\/strong><\/h5>\n\n\n\n

The platform tests eight key performance indicators<\/strong> (KPIs) of RFchips<\/strong>, which are critical to assessing the functionality and quality of the chips. These KPIs include:<\/p>\n\n\n\n

Input third-order intermodulation (IM3) cutoff point<\/strong><\/p>\n\n\n\n

Total gain range<\/strong><\/p>\n\n\n\n

Gain control range<\/strong><\/p>\n\n\n\n

1 dB compression point input power<\/strong><\/p>\n\n\n\n

Cifra de ruido<\/strong><\/p>\n\n\n\n

Local oscillator phase noise<\/strong><\/p>\n\n\n\n

Out-of-band suppression<\/strong><\/p>\n\n\n\n

Image suppression<\/strong><\/p>\n\n\n\n

For instance, in testing the input third-order intermodulation cutoff point<\/strong>, the platform simulates a nonlinear environment using dual-signal inputs. It then measures and calculates the RFchip\u2019s linearity<\/strong> performance with high precision.<\/p>\n\n\n\n

Testing Example: RX3701 RFchip<\/strong><\/strong><\/h5>\n\n\n\n

To validate the platform\u2019s effectiveness, the research team constructed a testing system using the RX3701 model RFchip<\/strong>. This RFchip<\/strong> supports multiple satellite navigation systems, offers a wide frequency range, and is suitable for various high-precision applications.<\/p>\n\n\n\n

Test results showed that the RX3701 RFchip<\/strong> met all design specifications. Notably, the input third-order intermodulation cutoff point<\/strong> fue 28.391 dBm<\/strong>, El total gain range<\/strong> fue 72.318 dB<\/strong>, y el noise figure<\/strong> fue 8.866 dB<\/strong>, demonstrating excellent RF performance.<\/p>\n\n\n\n

Efficient, Automated Testing for RFchips<\/strong><\/strong><\/h5>\n\n\n\n

The automated testing platform uses test templates<\/strong> to enable a one-click testing process, significantly reducing the need for manual intervention. This enhances both the efficiency and consistency of RFchip<\/strong> testing. Moving forward, the platform can be further expanded to accommodate the testing needs of various RFchip<\/strong> types, promoting the development of standardized and intelligent testing for RFchips<\/strong>.<\/p>","protected":false},"excerpt":{"rendered":"

RFchips are core components of navigation terminals, directly affecting the overall performance of terminal products. As the BeiDou satellite navigation system becomes more widely used, the demand for RFchip testing has surged. Traditional testing methods can no longer meet the increasing requirements for high efficiency and precision. To address this challenge, this paper designs and implements an automated […]<\/p>\n","protected":false},"author":1,"featured_media":1376,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[30,31],"tags":[36],"class_list":["post-1375","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-industry-insights","category-blog","tag-yvette-wu"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/posts\/1375","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/comments?post=1375"}],"version-history":[{"count":1,"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/posts\/1375\/revisions"}],"predecessor-version":[{"id":1377,"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/posts\/1375\/revisions\/1377"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/media\/1376"}],"wp:attachment":[{"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/media?parent=1375"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/categories?post=1375"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.wallisemi.com\/es\/wp-json\/wp\/v2\/tags?post=1375"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}